Description

BSA is procuring a Milli-Kelvin Scanning Probe Microscope. The mK-SPM instrument, shall operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature <= 20 mK inside a fully shielded low noise environment within high vacuum (HV).

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Contracting Office

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Attachments (7)

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