The National Institute of Standards and Technology (NIST) intends to negotiate, on a sole source basis, under the authority of FAR 13.106-1(b) (1), with Gatan Inc.,5794 W Las Positas BLVD, Pleasanton, California 94588, for the purchase a service maintenance agreement for an an existing Gatan EDAX Apex Pegasus microanalysis system on an existing Thermo Fisher Scientific (TFS) FEI Helios 660 microscope needed by the Materials Measurement Science Division (MMSD) of the Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST). The general mission of the Materials Measurement Science Division (MMSD) of the Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is to provide research, reference materials, and data to support accurate and selective analysis of microscopic particles and surfaces including the spatial distribution of chemical species relevant to industrial, environmental, and biological processes. Nanoscale imaging and microanalysis of materials is one of the main research topics. The proposed purchase is for annual service contract (base plus two option years) for the Gatan EDAX Apex Pegasus integrated microanalysis system (S/N 10929) with Octane Plus X-ray detector (S/N 4047) and Hikari Pro electron backscatter diffraction (EBSD) detector (S/N 3218) currently installed on the existing Thermo Fisher Scientific (TFS) FEI Helios 660 focused ion beam scanning electron microscope (FIB SEM) (NIST Property # 637285). Helios 660 is a critical component of several NIST and other agency support projects such as nanometrology and high resolution microanalysis method development projects. EDAX microanalysis system is a critical component for the analytical work performed using the Helios 660 FIB SEM. Sole source determination is based on the need to purchase an annual service contract (base plus four option years) for the Gatan EDAX Apex Pegasus integrated microanalysis system (S/N 10929) with Octane Plus X-ray detector (S/N 4047) and Hikari Pro electron backscatter diffraction (EBSD) detector (S/N 3218) currently installed on the existing Thermo Fisher Scientific (TFS) FEI Helios 660 focused ion beam scanning electron microscope (FIB SEM) (NIST Property # 637285). Helios 660 is a critical component of several NIST and other agency support projects such as nanometrology and high resolution microanalysis method development projects. Gatan EDAX microanalysis system is a critical component for the analytical work performed using the Helios 660 FIB SEM. Gatan EDAX microanalysis system (X-ray detector, EBSD detector, analyzer and software) is a complex and proprietary piece of equipment that must be maintained and tested according to the manufacturer (EDAX)'s specifications by the manufacturer's service engineers. All service level functions including the calibration and performance testing utilities are only accessible to Gatan EDAX service engineers and t…