Description

BACKGROUND This is a Sources Sought Notice (SSN) from industry to help determine the availability and capability of small business and other than small businesses that are capable of providing any or all of the products and services required by the U.S. Department of Commerce, National Institute of Standards and Technology (NIST). NIST is conducting market research to identify potential sources that can provide a High-Field Electromagnet System for MRAM Metrology that meets or exceeds all technical specifications, inclusive of delivery and installation support requirements identified in this notice. This notice is strictly to request information for market research purposes to help NIST determine the appropriate acquisition strategy for this requirement. This notice shall not be construed as a solicitation, an obligation, or commitment by NIST. The semiconductor supply chain is global, specialized, and interconnected. To address R&D ecosystem gaps, NIST will conduct measurement science, or metrology, critical to the development of new materials, devices, packaging, and production methods in chip manufacturing by US manufacturers. This potential requirement is for CHIPS project GC7.05: Assured Sanitization of Ultrahigh Density Magnetic Memory and Storage Devices. MRAM is an emerging memory that is already taking the place of embedded flash at advanced technology nodes. This project requires determination of the assured erasure (sanitization) of MRAM devices. The switching field probability distributions of MRAM devices will be measured to determine field values ensuring erasure of the entire distribution of devices. These values will inform NIST in the development of field-based sanitization protocols. The field may also be used to ensure the state of the device independent of electronic interface. OVERVIEW NIST has a potential requirement for a Contractor to provide a high-field electromagnet system, including a bipolar power supply system, to facilitate MRAM device metrology, meeting, or exceeding, the technical specifications below. This type of measurement requires magnetic fields to be applied in a wafer probe, in a direction perpendicular to the wafer, to be swept from negative to positive values. NIST will employ these measurements on many devices over the course of hours and days; therefore, repeatability and thermal stability are critical. The Contractor shall provide a High-Field Electromagnet System for MRAM Metrology that meets or exceeds all technical specifications identified below for Line Item 0001. Minimum Specifications: Line Item 0001 (Required) Description: High-Field Electromagnet System for MRAM Metrology Quantity: One (1) A. Technical Specifications: a. Field Strength: Must be capable of producing 0.5 T fields at approximately 5 mm from the pole face. b. Field Orientation: Capable of applying fields in the direction perpendicular to the wafer. c. Power Supply: Must include a dedicated…

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