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***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE*** In response to the CHIPS for America Act, NIST has a mission to perform and develop measurement science requested to support the domestic semiconductor industry. The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is involved in materials characterization efforts using atom probe tomography (APT). A particular research focus of the atom probe instrument is to study the effect of laser wavelength on semiconductor materials to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements. This work involves three-dimensional (3D) atomic imaging of nanoscale samples in an APT instrument. An APT instrument: (1) accepts nanoscale needle-shaped specimens and specimen array coupons for analysis, (2) triggers field ion evaporation of the specimen, (3) detects the emitted ions in time and space using time-of-flight (TOF) mass spectrometry, and (4) generates a 3-Dimensional (3D) computational reconstruction of the evaporated volume that can be used in further analysis. The Contractor shall deliver and install one microchannel plate gate (MCP gate) module upgrade for our existing LEAP 4000 X-Si atom probe microscope (S/N 5020) with features as defined in the “Minimum Requirements” section inclusive of FOB Destination. This includes any required additional hardware (e.g. high voltage supply, processing electronics, cables) required for integration with our CAMECA LEAP 4000 X-SI. The MCP gate upgrade module will be covered under warranty for at least one (1) year to include all parts (non-consumables), software, and labor. NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements: CLIN 0001 : Description : Microchannel plate gate upgrade module. Quantity : One (1) The MCP gate shall: Employ a nanosecond high-voltage pulse to gate the MCP detector in our CAMECA LEAP 4000 X-Si. The MCP gate will decrease the voltage on the MCPs by a sufficient amount that the MCPs are not saturated. In this way, it is possible to maintain a high sensitivity, even near very intense bunches, which are “gated off” and would otherwise saturate our detector. The gate pulse should be applied such that it does not affect the electric fields inside the flight tube of the TOF mass spectrometer. Enable the detector to act as a fast shutter to ignore specific signals in a defined TOF window relative to the trigger pulse (t0). Allow fast switching of MCP amplification, thus allowing NIST to choose to ignore signals that arrive in a specific time window following the trigger signal in the TOF mass spectrometry measurement required for performing atom probe tomography. Accommodate pulse frequency rates from 100 kHz to 200 kHz…

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