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***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE*** The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a high speed, Lock-in/Servo system. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Nikon Metrology, LLC (12701 Grand River RD, Brighton, Michigan 48116) under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334516. NIST has a need for a Nikon Optical Microscope that meets or exceeds the following draft minimum specifications: The National Institute of Standards and Technology (NIST), Physical Measurements Lab (PML), Quantum Nanoelectronics Group requires an Automated Inspection Optical Microscope to visualize, manipulate, and measure single atomic layer crystals to fabricate quantum devices. The microscope shall image silicon wafers and 2D quantum materials in visible and infrared light (IR), operating in reflection and transmission modes. The microscope shall be capable of automatically recording multiple images of adjacent areas of a wafer and stitching them into one image. The system shall also be capable of automatically taking multiple images at different focal heights. The optical microscope is part of a NIST-designed system used to fabricate low-dimensional van der Waals-based quantum devices for mission-critical experiments in physics and metrology, quantum information science, and electrical standards dissemination. For air-sensitive crystals, we require the optical microscope to be located in a glove box and remotely operated with full motorized controls for stage and focus movement. Motorization should allow the user to change the nosepiece objective, move between Brightfield, Darkfield, POL and DIC in reflected light, and control the XY Stage and Z-Focus through software. The optical microscope must be compatible with our existing NIKON MM-400SLU. Compatibility is required so that objective lenses, adapters, illuminators, and other parts can be shared between microscopes and operate using the same software platform, saving the government money in the need to purchase additional lenses, software, and training of personnel. Description: NIKON LV100NDA INSPECTION MICROSCOPE with the following minimum specifications, and required options Quantity: One (1) Minimum Specifications The microscope shall be capable of imaging silicon wafers and Van der Walls materials in transmitted and reflected light All microscope objectives should be capable of imaging reflected light in Brightfield, Darkfield, Polarized Light and DIC Motorization shall allow the user to change the nosepiece objective, move between Brightfield, Darkfield, POL and DIC in reflected light, and control the XY Stage and Z-Focus through the software. The reflected light source shall be capable of imaging in both Visible and Infrared light. The system s…

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