Femtosecond Laser Systemview on SAM.gov

Sources Sought Notice and Request for Information for NIST Femtosecond Laser System Notice ID: 1333ND-26-00088 Contract Opportunity Type: Sources Sought Response Date: September 4, 2026 Product Service Code (PSC): 6650 – Optical Instruments, Testing Equipment, Components, and Accessories NAICS Code: 334516 – Analytical Laboratory Instrument Manufacturing Background The National Institute of Standards and Technology (NIST) Quantum Measurement Division (QMD) in the Physical Measurement Laboratory (PML) develops novel spectroscopic measurement techniques to probe key physicochemical properties of low dimensional, advanced quantum materials (i.e., 2D…) that will enable future technologies to move past conventional digital computing. Determining the fundamental processes of quasiparticles and related charge migration and phase change phenomenon are key aspects of work performed in QMD. Additionally, the group studies alternative-state variables or information carriers, such as spin, phase, valley, etc., which will provide the foundation for lower-power electronics, optical switching, non-volatile memory, neuromorphic computing, and other technologies that are not possible with present material systems. Visible wavelength measurement systems, both in the linear and non-linear regime, enable detection of scattering, absorption, emission, and magnetism in these materials. To support the group's research activities and to measure the interaction of quasiparticles, including phonons, magnons and excitons, the Fundamental Electrical Metrology Group (FEMG) requires a fixed frequency, femtosecond laser system for multi-photon imaging within an already operating Raman microscope. Second harmonic generation (SHG) microscopy will be enabled with the new laser system. This laser system shall be used for SHG studies of novel quantum nanomaterials at varying temperatures and magnetic/electric fields. The system must be compatible with the extensive existing spectroscopic infrastructure already in use. Due to space limitations the laser system must not require external cooling, such as that with water. As part of the CHIPS Act, researchers from NIST are actively pursuing a comprehensive program in metrology research and development aimed at bolstering the U.S. semiconductor industry. A pivotal aspect of their strategic objectives is outlined in one of the seven Grand Challenges—specifically, Grand Challenge 1. This challenge focuses on enhancing metrology tools and measurement science dedicated to assessing the Purity, Properties, and Provenance of materials, which are critical for advancing the semiconductor sector. A targeted initiative under this challenge involves the evaluation of the reliability of both two-dimensional (2D) and wide band gap (WBG) materials and devices. This evaluation is crucial for understanding the robustness and potential applications of these advanced materials in the semiconductor industry. To effectively conduct this rese…